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IEEE Design
Results: 734

#	Item
521	IEEE Standards Coordinating Committee 20: Standards for System Test A Report of the SCC20 Strategic Planning Working Group Prepared for Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 1998-08-20 08:06:28 Electronic engineering IEEE Standards Association Abbreviated Test Language for All Systems Institute of Electrical and Electronics Engineers International Organization for Standardization IEEE Computer Society Design for testing Standards organizations Measurement Engineering
522	1 Yuichiro FUJIWARA Mathematics[removed]California Institute of Technology Pasadena, California 91125, USA Add to Reading List Source URL: www.its.caltech.edu Language: English - Date: 2014-01-29 08:17:53 Combinatorics IEEE Transactions on Information Theory Algebraic combinatorics Quantum information Quantum error correction Combinatorial design Computer science Applied mathematics Mathematics Quantum information science Design of experiments
523	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 22, NO. 10, OCTOBER[removed]A Compact Transregional Model for Digital CMOS Circuits Operating Near Threshold Add to Reading List Source URL: www.async.caltech.edu Language: English - Date: 2014-09-24 17:59:20 Electromagnetism Electronic design Logic families MOSFET Drain Induced Barrier Lowering Threshold voltage Field-effect transistor CMOS IC power supply pin Electronic engineering Electrical engineering Integrated circuits
524	Draft Minutes, SCOPS October 15 Meeting, Boston 9:00-4:30 PM Minutes compiled by Bill Hagerup Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-10-26 14:49:15 Amplifiers Signal processing Electronic design Scattering parameters Step response Overshoot Rise time Test probe Electronic engineering Electronics Electromagnetism
525	DYNAMIC TESTING FOR RADIATION INDUCED FAILURES IN A STANDARD CMOS SUBMICRON TECHNOLOGY PIXEL FRONT-END1 D. De Venuto, F. Corsi°, member IEEE , M. J. Ohletz^, member IEEE Dipartimento di Elettrotecnica ed Elettronica Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 1999-10-17 21:34:03 Integrated circuits Digital electronics Electronic design Electronic circuits Comparator Detectors Radiation hardening Flip-flop CMOS Electronic engineering Electronics Electromagnetism
526	1. ASSIGNED PROJECT NUMBER[removed]TITLE OF DOCUMENT IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std[removed]for Analog and Mixed Signal Environments 7. WORKING GROUP INFORMATION: Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-11-29 11:58:17 Analog signal Electronic design Video signal Digital VHDL-AMS Verilog-A Electronic engineering Electronics Hardware description languages
527	IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, VOL. 30, NO. 8, Add to Reading List Source URL: www.cs.umd.edu Language: English - Date: 2004-07-30 13:02:12 Widget toolkits Graphical user interfaces Java platform Scene graph Software architecture Software design patterns Swing Autodesk Softimage Model–view–controller Software Computing System software
528	Causality and Waveguide Circuit Theory Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fa Add to Reading List Source URL: www.nist.gov Language: English - Date: 2010-07-20 13:22:53 Physical quantities Electrical components Electronic design Cables Telecommunications engineering Electrical impedance Transmission line Wave impedance Waveguide Electronic engineering Electromagnetism Physics
529	356 IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 17, NO. 2, APRIL 2012 Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner Add to Reading List Source URL: www.kam.k.leang.com Language: English - Date: 2012-04-06 14:49:23 Elasticity Structural analysis Solid mechanics Continuum mechanics Vibration isolation Bending Stiffness Atomic force microscopy Mechanism Physics Mechanics Mechanical engineering
530	Cramming More Components onto Integrated Circuits GORDON E. MOORE, LIFE FELLOW, IEEE With unit cost falling as the number of components per circuit rises, by 1975 economics may dictate squeezing as many as[removed] Add to Reading List Source URL: www.cs.utexas.edu Language: English - Date: 2009-09-16 10:55:29 Integrated circuits Semiconductor devices Electronic design Integrated circuit Electronic circuit Digital electronics Application-specific integrated circuit Transistor Microelectronics Electronic engineering Electromagnetism Electronics

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